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Single connection device characterization (SCDC) with R&S®ZVA presented at EuMW 2011

At the European Microwave Week 2011 in Manchester, Rohde & Schwarz presented single connection device characterization (SCDC) based on a R&S®ZVA vector network analyzer. SCDC enables to carry out all relevant measurements on a mixer or amplifier within a single connection. S-parameter and compression point measurements at different frequencies, as well as noise figure and intermodulation distortion measurements are carried out at the same time. It is not required to reconnect the device under test which is particularly important for on-wafer measurements.

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