R&S®ZVAB-K2 Time Domain (TDR)

(for R&S®ZVA, R&S®ZVB, R&S®ZVT)

Key Facts

This option allows complex S-parameters to be transformed into the time domain, making it possible to display discontinuities versus the time delay or the electrical/mechanical length of the device under test.

The impulse response represents the reflection factor of a discontinuity (i.e. the peak of the "reflected" signal versus the runtime or the electrical/mechanical length). In addition, the DUT's step response can be calculated in order to display the impedance versus the length, for example.

You can conveniently select a bandpass characteristic or a lowpass characteristic – the lowpass characteristic has, among other things, the effect of doubling the resolution.

By setting a window in the time domain (gating function), you can display S-parameters for a specific section of the DUT. When measuring a cable that contains several discontinuities, for example, it is thus possible to separately determine the reflection S11 of a particularly slight discontinuity.

Five filter types are available for optimizing peak width/resolution and side lobe suppression.

Enhanced resolution with linear prediction function

With conventional TDR methods, the resolution, i.e. the width of reflected-signal peaks and the rise time of step responses, is limited by the network analyzer's frequency range. The R&S®ZVA does away with this limitation. Its linear prediction function expands the frequency spectrum by way of computation. Using a prediction factor of three, for example, will reduce the peak width or the rise time by a factor of three – yielding a resolution corresponding to that of a network analyzer with three times the frequency range.

Using this function, you can analyze considerably finer structures than was previously possible due to the limitation to the analyzer's actual frequency range. This function also allows narrowband and frequency-limited DUTs to be measured with higher accuracy.