R&S®FS-K40 Application Firmware for Phase Noise Measurement

Applications

Phase noise measurement of a signal source at 812 MHz. Settings, residual noise and spot noise values are displayed in the table in the upper part of the screen. The vertical red lines are the evaluation lines for residual noise. The result of the LIMIT line check is PASS.

R&S®FS-K40 Application Firmware for Phase Noise Measurement Applications

Phase noise measurement of a signal source at 640 MHz showing the unrivaled noise performance of the R&S® FSU and R&S® FSQ at offset frequencies from 100 Hz to 100 kHz. Settings, residual noise and spot noise values are displayed in the table in the upper part of the screen.

R&S®FS-K40 Application Firmware for Phase Noise Measurement Applications

The Measurement Settings menu enables you to adjust the sweep mode (normal, averaged, fast, manual), the offset frequencies for phase noise measurements, the filter RBWs, filter types (FFT) and averages. If the manual mode is selected, you can also choose Preset Settings to perform quick adjustments.

R&S®FS-K40 Application Firmware for Phase Noise Measurement Applications

The General Settings menu enables you to set general measurement parameters such as frequency and level. You can activate the evaluation lines and adjust the spot frequency points. To avoid measurements with incorrectly set parameters, select Verify Frequency & Level. To obtain fast initial results, make sure that Sweep Forward is not enabled.

R&S®FS-K40 Application Firmware for Phase Noise Measurement Applications

After every subsweep the frequency and level of the oscillator can be verified and corrected. The offset values are displayed on the screen.

R&S®FS-K40 Application Firmware for Phase Noise Measurement Applications

Linear or logarithmic smoothing algorithms can be selected showing different results, especially concerning spurious lines.

R&S®FS-K40 Application Firmware for Phase Noise Measurement Applications

The reference measurement (green line) shows the noise floor of the setup. The step at 300 kHz offset frequency is caused by change of IF gain in the spectrum analyzer. The reference measurement curve can be substracted from the Phase Noise measurement by using the TRACE MATH functionality.

R&S®FS-K40 Application Firmware for Phase Noise Measurement Applications