R&S®FSV-K40 Phase noise measurement application

Key Facts

Phase noise is an important parameter in wireless communications systems. The R&S®FSV-K40 option enables the R&S®FSV to perform fast and easy phase noise measurements in development and production.

When equipped with the R&S®FSV-K40 option, the R&S®FSV can measure the single sideband phase noise across a selectable carrier offset frequency range with logarithmic display of the offset range. Based on the measured phase noise, the user can also determine the residual FM/PM and the jitter.



Phase noise measurement

  • Carrier offset frequency range selectable from 1 Hz to 1 GHz in 1/3/10 sequence (1 Hz, 3 Hz, 10 Hz, 30 Hz, etc.)
  • Number of averages, sweep mode and filter bandwidth for every measurement subrange can be individually selected to optimize the measurement speed
  • Fast results for the subranges are obtained by starting the measurement at the maximum carrier offset
  • Verification of carrier frequency and power prior to each measurement avoids incorrect measurements
  • Improvement of dynamic range by measuring the thermal inherent noise in a reference trace and performing noise correction

    • 

Measurement of residual FM/PM and jitter

  • Integration across the entire selected carrier offset frequency range or across a separately selectable frequency range
  • Tabular display of residual FM, residual PM and RMS jitter in addition to measurement trace

    • 

Evaluation aids

  • Limit lines with PASS/FAIL indication
  • Spot phase noise at up to four selectable frequency offsets
  • Maximum of four additional markers

    • 

Related Products